Anomalies in the low temperatures thermal and electrical resistivities of gold

The knowledge on the influence of surface roughness and the electron-phonon (el-ph) interaction on electrical transport properties of nanoscale metal films is important from both fundamental and technological points of view. Here we report a study of the temperature dependent electron transport properties of nanoscale copper films by measuring temperature dependent electrical resistivity with thickness ranging from 4 to 500 nm. We show that the residual resistivity, which is temperature independent, can be described quantitatively using both measured vertical surface root-mean-square roughness and lateral correlation length in the nanoscale, with no adjustable parameter, by a recent quasi-classical model developed by Chatterjee and Meyerovich (2010 Phys. Rev. B 81 245409-10). We also demonstrate that the temperature dependent component of the resistivity can be described using the Bloch-Grüneisen equation with a thickness dependent el-ph coupling constant and a thickness dependent Debye temperature. We show that the increase of the el-ph coupling constant with the decrease of film thickness gives rise to an enhancement of the temperature dependent component of the resistivity.

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“…with or without the interference terms. This implies that equation (8) only gives a bulk-like temperature dependent resistivity.…”

Section: 32mentioning

confidence: 99%

“…0 At a higher temperature phonon scattering processes lead to the temperature dependent component of the resistivity, ρ T [7][8][9]. Therefore, the total resistivity is given by…”

Section: Introductionmentioning

confidence: 99%