In this work, we investigated the anisotropic thermal transport in two-dimensional (2D) perovskite (phenethylammonium lead iodide) nanolayers through a novel measurement technique called crosssectional scanning thermal microscopy (xSThM). In this method, a target perovskite layer on a substrate was oblique polished with an Ar ion beam to create a low-angle wedge with nanoscale roughness that is followed by high vacuum SThM to obtain the thermal conductance map as a function of local thickness.The experimentally obtained data were processed with an analytical model and validated by the finite elemental analysis simulation to quantify the in-plane (𝑘 𝑙,𝑥𝑦 ) and cross-plane thermal conductivities (𝑘 𝑙,𝑧 ) of the 2D perovskite from a single set of measurements with nanoscale resolution. We obtained ultra-low thermal conductivity (𝑘 𝑙 = 0.25 ± 0.05 Wm -1 K -1 ) for the 2D perovskite along with an anisotropy (𝑘 𝑙,𝑥𝑦 = 0.45 ± 0.05 Wm -1 K -1 and 𝑘 𝑙,𝑧 = 0.13 ± 0.05 Wm -1 K -1 ) linked to the unique structure of the perovskite and different phonon lifetimes and group velocities for in-plane and out-of-plane directions. The results that are available for the first time, are essential for the thermal management of 2D perovskite-based optoelectronic devices, and potential thermoelectric applications of these materials.