1998
DOI: 10.1016/s0921-5093(97)00490-5
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Anomalous microsegregation in Al–Si foundry alloys

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Cited by 15 publications
(13 citation statements)
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“…Dons et al [62] showed that the anomalous segregation profile for Si was caused by diffusion of Si from the α-Al matrix to Si particles in s segregation profiles for Si were confirmed by solidification rates for all three alloys, see Figure hown The presented Cu concentrations in the centre of the dendrite arms show some variations and values of 1.2 wt% [63] and 0.6 wt% [64] are reported for an Al-7Si-3.5Cu alloy. The consistency in reported data is better for Mg [61,65] and is in line with data from the present investigation. Possible reasons for deviations in the reported results in the literature are differences in measurement method used, EDS or WDS, and the difficulty of finding a dendrite that is cut through its centre.…”
Section: Segregation Profiles Of Alloying Elementssupporting
confidence: 92%
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“…Dons et al [62] showed that the anomalous segregation profile for Si was caused by diffusion of Si from the α-Al matrix to Si particles in s segregation profiles for Si were confirmed by solidification rates for all three alloys, see Figure hown The presented Cu concentrations in the centre of the dendrite arms show some variations and values of 1.2 wt% [63] and 0.6 wt% [64] are reported for an Al-7Si-3.5Cu alloy. The consistency in reported data is better for Mg [61,65] and is in line with data from the present investigation. Possible reasons for deviations in the reported results in the literature are differences in measurement method used, EDS or WDS, and the difficulty of finding a dendrite that is cut through its centre.…”
Section: Segregation Profiles Of Alloying Elementssupporting
confidence: 92%
“…The concentration profiles for Si for differe solidification rates have been studied by Pedersen et al [61]. gation profiles of Si, Mg and Cu in the α-nt segregation profile was observed, with higher Si concentration in the centre of the dendrite arm compared to the edges, for alloys solidified slowly.…”
Section: Segregation Profiles Of Alloying Elementsmentioning
confidence: 95%
“…Higher levels of Si are observed at the edge of the dendrite compared to the centre for the samples with lower SDAS, which are also generally having higher overall Si concentrations compared to the two coarser microstructures. The result is in SDAS ~ 10 µm SDAS ~ 25 µm SDAS ~ 50 µm agreement with Pedersen et al [12] and Hons et al [13] and lately confirmed by hardness measurement confirmed by Seifeddine et al [14]. For the slowly solidified materials, Si could be diffused from the α-Al matrix to Si particles in the eutectic after solidification.…”
Section: Microstructure Characterizationsupporting
confidence: 79%
“…The PFZ around the eutectic particles was attributed to the loss of Si by diffusion to the eutectic particles. In another study, Pedersen and Arnberg [13] investigated the microsegregation of Si within Al dendrites by microprobe analysis and found that peak concentration was in the midpoint of the dendrites. These results were later verified by simulations of Dons et al, [14] who concluded Fig.…”
Section: B Quench Precipitatesmentioning
confidence: 99%