Jpn. J. Appl. Phys.
 2011
DOI: 10.7567/jjap.50.111301
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Anomalous Oxide Charge Variation Identified by Alternating Current Surface Photovoltage Method in Cr-Aqueous-Solution-Rinsed p-Type Si(001) Wafers Exposed to Air

Hirofumi Shimizu1,
Yuji Sanada2
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