1998
DOI: 10.1016/s0042-207x(98)00076-1
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Anomalous temperature dependence of series resistance in Ag\Si and Al\Si Schottky junctions

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Cited by 14 publications
(3 citation statements)
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“…The decrease in series resistance with an increasing temperature is usual behavior for semiconductors. Such temperature dependence of R s is an obvious agreement with the reported negative temperature coefficient of the R s 29, 30. However, the detail of the effect of radiation and the illumination on electrical characteristics of these devices is unclear.…”
Section: Resultssupporting
confidence: 87%
“…The decrease in series resistance with an increasing temperature is usual behavior for semiconductors. Such temperature dependence of R s is an obvious agreement with the reported negative temperature coefficient of the R s 29, 30. However, the detail of the effect of radiation and the illumination on electrical characteristics of these devices is unclear.…”
Section: Resultssupporting
confidence: 87%
“…Such enhanced broadband absorbance would result in the Au NPs converting most of the incident white light to heat, accompanied by a significant increase in the global temperature. Moreover, we also casted the composite films onto thermally sensitive Schottky diodes, as displayed in Figure b. The SiO 2 layer was used as a passivation layer and also enhanced the affinity between the polymer matrix and the metal electrode.…”
Section: Resultsmentioning
confidence: 99%
“…In other words, almost all of the incident photons would have been trapped in the composite film to increase the global temperature rather than reach the Al–Si interface to generate electron/hole pairs. On the other hand, temperature-dependent I – V curves of metal/semiconductor Schottky diodes have been reported from a few studies. , For example, the Al/Si Schottky diode displays a nearly linear increase in reverse current at a constant reverse bias with respect to temperature (Figure S13), presumably because more carriers with sufficient energy are collected to the opposite electrodes upon increase of the temperature, thereby contributing to the measured current. Therefore, we suspected that the enhancement in reverse current of the integrating system under illumination arose predominantly from the elevated temperature at the interface, rather than from the light-induced generation of electron/hole pairs.…”
Section: Resultsmentioning
confidence: 99%