Anomalous X-ray Scattering on Semiconducting Glasses at ESRF: Review in Recent Fifteen Years

Abstract

The most difficult issue for the structural characterizations for non-crystalline multi-component materials is to determine partial structures because

Structure Determination in a New Class of Amorphous Cluster Compounds with Extreme Nonlinear Optical Properties

“…20,21) Therefore, AXS data analysis is typically combined with Reverse Monte Carlo (RMC) simulations. 25,26) However, both NDIS and AXS are sophisticated and difficult methods, and a high level of experience is required to reliably perform the associated data analyses.…”

Detailed structural analysis of amorphous Pd40Cu40P20: Comparison with the metallic glass Pd40Ni40P20 from the viewpoint of glass forming ability

“…The AXS experiments were carried out using a standard ω − 2θ diffractometer installed at the beamline BM02 of the European Synchrotron Radiation Facility (ESRF) in Grenoble, France. The principle and experimental procedure of AXS are given in our previous paper [1] and others [13,14,15]. To obtain differential structure factors, ∆ k S(Q), close to the Pd and Cu K absorption edges, two scattering experiments were performed at room temperature at incident X-ray energies of 30 and 200 eV below the Pd K edge (24.350 keV) and 20 and 200 eV below the Cu K edge (8.979 keV).…”