2002
DOI: 10.1524/zpch.2002.216.10.1219
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Anomalous X-Ray Scattering Studies on Glassy GexSe1−x across the Stiffness Threshold Composition x = 0.20

Abstract: Anomalous x-ray scattering experiments on glassy Ge x Se 1−x have been carried out at energies close to the Ge and Se K edges at concentrations close to the onset-and at the mid-point of the rigidity percolation threshold (x = 0.195 and 0.23). The total structure factors S(Q) show rapid variations in both the position and intensity of the prepeak around 11 nm −1 , while it stays almost unchanged in the remaining Q range. The differential structure factors ∆ i S(Q) comprise characteristic features. Comparing th… Show more

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Cited by 43 publications
(55 citation statements)
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“…Following the procedure given in Ref. [10], differential structure factors, ∆ k S(Q), were obtained from the difference between diffraction data with two different incident x-ray energies near each K edge of k element.…”
mentioning
confidence: 99%
“…Following the procedure given in Ref. [10], differential structure factors, ∆ k S(Q), were obtained from the difference between diffraction data with two different incident x-ray energies near each K edge of k element.…”
mentioning
confidence: 99%
“…[8], ∆ i S(Q) were calculated from the scattering data. For each ∆ i S(Q), the corresponding i-th edge element related partial structure factors, S ij (Q), dominates ∆ i S(Q).…”
Section: Methodsmentioning
confidence: 99%
“…8) Following the procedure given in Ref. 9), Á Pd SðQÞ was calculated from the scattering data. The large contributions of S ij ðQÞ (more than 0.05) to the Á Pd SðQÞ and SðQÞ in Pd 42:5 Ni 7:5 Cu 30 P 20 alloy at the first maximum around 29 nm À1 in SðQÞ are tabulated in Table 1.…”
Section: Methodsmentioning
confidence: 99%