The ferroelectric properties of fluorite-structured oxides
have
attracted significant attention from researchers because of their
potential applications in nonvolatile memory devices, which are enabled
by their compatibility with the complementary metal oxide semiconductor
technology and physical scalability to a thickness below 10 nm. Another
important emerging property of these materials is their antiferroelectricity,
which originates from the field-induced transition between the polar
and nonpolar phases. Various applications of fluorite-structured antiferroelectrics,
such as those in volatile logic devices and cell capacitors for dynamic
random-access memory, engineered nonvolatile memory, and energy storage/conversion
devices, have been recently proposed, although they have not been
investigated in detail compared to fluorite-structured ferroelectrics.
The volatile nature of fluorite-structured antiferroelectrics with
a characteristic field-induced phase transition, which clearly distinguishes
them from ferroelectrics, have endowed these materials with unique
properties that cannot be achieved by ferroelectrics. Therefore, the
emerging antiferroelectricity of fluorite-structured oxides is comprehensively
reviewed in this paper from its fundamentals to various semiconductor
applications based on the existing literature.