2016
DOI: 10.3367/ufnr.2016.05.037817
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Apertureless near-field optical microscopy

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Cited by 4 publications
(1 citation statement)
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“…This intrinsic limit, also known as diffraction limit [ 29 , 30 ], has become the main obstacle to high-resolution optical imaging. Thus far, a great number of novel methods for achieving super-resolution imaging have been proposed and demonstrated experimentally in both near field and far field, such as near-field scanning optical microscopy (NSOM) [ 31 , 32 , 33 ]; far-field superlens (FSL) [ 34 , 35 , 36 ], hyperlens [ 37 , 38 , 39 ], and metalens [ 40 , 41 , 42 , 43 ]; stimulated emission depletion microscopy (STED) [ 44 , 45 , 46 , 47 ]; stochastic optical reconstruction microscopy (STORM) [ 48 , 49 , 50 , 51 , 52 ]; structured illumination microscopy (SIM) [ 53 , 54 , 55 ]; plasmonic structured illumination microscopy derived from SIM [ 56 , 57 , 58 ], and so on [ 59 , 60 ]. It is worth mentioning that graphene-related materials exhibit different properties according to their lateral size, number of layers and oxidation degree.…”
Section: Introductionmentioning
confidence: 99%
“…This intrinsic limit, also known as diffraction limit [ 29 , 30 ], has become the main obstacle to high-resolution optical imaging. Thus far, a great number of novel methods for achieving super-resolution imaging have been proposed and demonstrated experimentally in both near field and far field, such as near-field scanning optical microscopy (NSOM) [ 31 , 32 , 33 ]; far-field superlens (FSL) [ 34 , 35 , 36 ], hyperlens [ 37 , 38 , 39 ], and metalens [ 40 , 41 , 42 , 43 ]; stimulated emission depletion microscopy (STED) [ 44 , 45 , 46 , 47 ]; stochastic optical reconstruction microscopy (STORM) [ 48 , 49 , 50 , 51 , 52 ]; structured illumination microscopy (SIM) [ 53 , 54 , 55 ]; plasmonic structured illumination microscopy derived from SIM [ 56 , 57 , 58 ], and so on [ 59 , 60 ]. It is worth mentioning that graphene-related materials exhibit different properties according to their lateral size, number of layers and oxidation degree.…”
Section: Introductionmentioning
confidence: 99%