Apparatus for measurements of thermal and optical stimulated exo-electron emission and luminescence

Abstract

The purpose of the design, construction and implementation of vacuum apparatus for measuring simultaneously three or more stimulated phenomena in dielectrics and eventually semiconductors is to investigate those phenomena as a function of temperature and wavelength. The test of equipment and its functionality were carried out step by step (apparatus, components and control sample) and associated with the calculation of the main physical parameters. The tests of individual parts of the apparatus clearly confirmed that the design, construction and selected components fulfil or even exceed the required properties. On the basis of the measurement of selected sample, it was shown that even weak signals from the material can be detected from both thermally stimulated luminescence and thermally stimulated exo-electron emission moreover transmission and desorption can be measured. NaCl:Ni (0.2%) was chosen as the test material. The activation energies and frequency factor were calculated using the methods of different authors.