2024
DOI: 10.1587/elex.21.20230495
|View full text |Cite
|
Sign up to set email alerts
|

Application dependent FPGA interconnect test method with small test configuration number using SMT net-grouping constraints

Xinyu He,
Jinmei Lai

Abstract: An application dependent FPGA interconnect testing scheme is presented. The goal is to reduce the number of test configurations while keeping high fault coverage. Reduction is done by using SMT constraints that allow multiple nets as a group to use one input vector, so that the number of test configurations is reduced. Based on the complete fault model, a novel approach to generate SAT formulas, most notably dominant bridging faults, are explained to retain coverage. Experiments on FPGAs shown that this method… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 25 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?