2015
DOI: 10.1016/j.elspec.2015.03.009
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Application of a time-of-flight spectrometer with delay-line detector for time- and angle-resolved two-photon photoemission

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Cited by 8 publications
(4 citation statements)
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“…The present implementation of VMI for studying surfaces and supported nanoparticles is motivated by the enormously successful application of the technique in molecular spectroscopy and dynamics while also drawing inspiration from conventional angle-resolved photoemission spectroscopy (ARPES) on surfaces. A number of ARPES techniques have been established over the years, including what may be considered “traditional” ARPES using a hemispherical analyzer, , more recent angle-resolved time-of-flight (AR-TOF) setups using a delay line detector for concurrent 3D detection, and momentum imaging using a PEEM column and two hemispherical analyzers . Time-, position-, and 1D energy-resolved PEEM also provides impressive capabilities for studying single-nanoparticle plasmonics and electron dynamics, , and nano-ARPES is under development for high spatial and angular resolution .…”
Section: Introductionmentioning
confidence: 99%
“…The present implementation of VMI for studying surfaces and supported nanoparticles is motivated by the enormously successful application of the technique in molecular spectroscopy and dynamics while also drawing inspiration from conventional angle-resolved photoemission spectroscopy (ARPES) on surfaces. A number of ARPES techniques have been established over the years, including what may be considered “traditional” ARPES using a hemispherical analyzer, , more recent angle-resolved time-of-flight (AR-TOF) setups using a delay line detector for concurrent 3D detection, and momentum imaging using a PEEM column and two hemispherical analyzers . Time-, position-, and 1D energy-resolved PEEM also provides impressive capabilities for studying single-nanoparticle plasmonics and electron dynamics, , and nano-ARPES is under development for high spatial and angular resolution .…”
Section: Introductionmentioning
confidence: 99%
“…The electron current distribution in this paper is essentially the same as the time-of-flight plot [35] and can be measured using the experimental device in our previous works [30,35], except that the MCP and data acquisition card should have a higher time resolution on the order of picoseconds, which is a challenge under current electron detection technology. A delay-line position-sensitive detector may be used in the experiment in the future, which can present a time resolution up to 70 ps [36,37]. In addition, the spatial measurement of ionization microscopy is carried out in [3,25].…”
Section: Theory and Numerical Approachmentioning
confidence: 99%
“…MPES, also called the momentum microscopy (MM), is born out of the recent integration of time-of-flight (TOF) electron spectrometers with delay-line detectors (DLDs) and improved electron-optic lens designs [12,13,14,15]. Compared with the earlier generations of angle-resolved photoemission spectroscopy (ARPES) [16,17,18] that uses a hemispherical analyzer to measure the 2D energy-momentum distribution of the photoemitted electrons [19], MPES is capable of recording single-electron events simultaneously sorted into the (k x , k y , E) coordinates (E: electron energy, k x , k y : parallel momentum components) in band mapping experiments, obviating the need for scanning across sample orientations and data merging as is the case for similar experiments based on ARPES.…”
Section: Introductionmentioning
confidence: 99%