2022
DOI: 10.1016/j.matchar.2022.111741
|View full text |Cite
|
Sign up to set email alerts
|

Application of advanced (S)TEM methods for the study of nanostructured porous functional surfaces: A few working examples

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
5
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 6 publications
(5 citation statements)
references
References 99 publications
0
5
0
Order By: Relevance
“…As HAADF‐STEM takes images on the basis of electron‐beam diffraction, the bright‐dark contrast in an image reflects the atom numbers of elements (called z‐contrast). [ 13,26 ] The bright/dark area in Figure 6g corresponds to the dark/bright area in Figure 6e, respectively, indicating the thick/thin region of the sample. The fairly uniform contrast for most parts of the particular area in Figure 6g implies the even distribution of all elements.…”
Section: Resultsmentioning
confidence: 99%
“…As HAADF‐STEM takes images on the basis of electron‐beam diffraction, the bright‐dark contrast in an image reflects the atom numbers of elements (called z‐contrast). [ 13,26 ] The bright/dark area in Figure 6g corresponds to the dark/bright area in Figure 6e, respectively, indicating the thick/thin region of the sample. The fairly uniform contrast for most parts of the particular area in Figure 6g implies the even distribution of all elements.…”
Section: Resultsmentioning
confidence: 99%
“…The transmitted electrons can be analyzed by various detectors to provide accurate information about atomic arrangement, crystalline phases and defects, allowing for the achievement of structural, chemical and electronic characterization across length scales ranging from the atomic scale crystallography to the microstructure. Advanced TEMs are capable of an atomic-scale resolution below 0.5 Å, which is especially suited to probe thin film interfaces, defects, grain structure, orientations, dislocations, and more [59,60]. However, due to the relatively short mean free path of electrons in matter, samples must be suitably prepared as thin slices, so to study thin films, it is necessary to cut thin cross-sections of the samples (cross-sectional TEM (XTEM)) using, for example, a focused ion beam (FIB) facility.…”
Section: Scanning Transmission Electron Microscopy (Tem)mentioning
confidence: 99%
“…An alternative to assessing tortuosities of porous materials by PFG NMR diffusion measurements are microscopy-based methods. A technique which, in this respect, underwent a steep development in the recent years and proved its capability to provide such information and to furthermore give detailed insight into the mesoscopic structure of porous materials is STEM tomography [14][15][16]. To this end, thin electron transparent specimen in the range of a few 10 nm need to be prepared.…”
Section: Determination Of Tortuosities By Stem Tomographymentioning
confidence: 99%
“…(For more details, the interested reader is referred to Refs. [14][15][16]). By applying a further numerical analysis, also tortuosity factors characterizing the pore system can be determined [64,65].…”
Section: Determination Of Tortuosities By Stem Tomographymentioning
confidence: 99%
See 1 more Smart Citation