2005
DOI: 10.1163/1568561054352667
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Application of atomic force spectroscopy (AFS) to studies of adhesion phenomena: a review

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Cited by 90 publications
(70 citation statements)
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“…In 1982, the scanning tunnelling microscope (STM) was developed as a tool to image metallic and semiconducting surfaces with high resolution [1,9,51,55,88]. This discovery later prompted the development of several advanced high-resolution imaging techniques, which scan point probes in a raster pattern across the sample surface to detect various interaction forces.…”
Section: The Atomic Force Microscopementioning
confidence: 99%
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“…In 1982, the scanning tunnelling microscope (STM) was developed as a tool to image metallic and semiconducting surfaces with high resolution [1,9,51,55,88]. This discovery later prompted the development of several advanced high-resolution imaging techniques, which scan point probes in a raster pattern across the sample surface to detect various interaction forces.…”
Section: The Atomic Force Microscopementioning
confidence: 99%
“…It is used not only in physical, chemical, biological, medical and material research laboratories, but also for product development and quality control. The success of the AFM is attributed to the high resolution and the versatility, with which it can map not only the topography of sample surfaces in the sub-micrometre scale, but also physical properties depending on the interaction forces between the tip and the sample surface [26,32,51,55,65]. As elaborated by Starostina and West [88] and Prater et al [76], the AFM is capable of producing 3D topographical information from the Å to the lm level with high resolution.…”
Section: The Atomic Force Microscopementioning
confidence: 99%
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“…A photodiode detector is used to detect the deflection of the cantilever using a laser light reflection of the surface of the cantilever. See Liette and Herrmann for further details regarding the operation of an AFM 50) . Fig.…”
Section: Adhesion and Atomic Force Microscopymentioning
confidence: 99%
“…The second is atomic force spectroscopy (AFS), one of the most promising and interesting research areas related to SPM, allowing the study of surface interactions between a tip and sample surface from a theoretical point of view by means of forcedistance curves, measuring forces as a function of distance. These curves can be employed for the study and measurement of numerous materials properties such as elasticity, Hamaker constant, surface charge densities and degrees of hydrophobicity and also for the characterization of all the known kinds of surface forces 3 .…”
Section: Introductionmentioning
confidence: 99%