2017
DOI: 10.1180/minmag.2016.080.150
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Application of benchtop micro-XRF to geological materials

Abstract: Recent developments in X-ray optics have allowed the development of a range of commercially available benchtop micro-XRF (μ-XRF) instruments that can produce X-ray spot sizes of 20-30 μm on the sample, allowing major and trace element analysis on a range of sample types and sizes with minimal sample preparation. Such instruments offer quantitative analysis using fundamental parameter based "standardless" quantification algorithms. The accuracy and precision of this quantitative analysis on geological materials… Show more

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Cited by 89 publications
(65 citation statements)
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“…For X-ray fluorescence (XRF) mapping of polished thin-sections, we used a Bruker benchtop M4 Tornado μ-XRF instrument (see Flude et al 2017). This system has a Rh X-ray tube, dual silicondrifted detectors (SDDs), and polycapillary optics giving an X-ray beam with a nominal spot size of 20 μm and similar steps allowing for element mapping of a full polished thin-section at a similar pixel resolution of roughly 20 μm.…”
Section: A Sampling and Technical Detailsmentioning
confidence: 99%
“…For X-ray fluorescence (XRF) mapping of polished thin-sections, we used a Bruker benchtop M4 Tornado μ-XRF instrument (see Flude et al 2017). This system has a Rh X-ray tube, dual silicondrifted detectors (SDDs), and polycapillary optics giving an X-ray beam with a nominal spot size of 20 μm and similar steps allowing for element mapping of a full polished thin-section at a similar pixel resolution of roughly 20 μm.…”
Section: A Sampling and Technical Detailsmentioning
confidence: 99%
“…Processing the XRF spectra collected during mapping allows for the calculation of desired elements that can then be presented as a compositional map. Compositional mapping of polished thin sections using micro-XRF, combined with other petrographic methods, allows for the comprehensive characterization of elemental distributions in a sample (e.g., [28,29]).…”
Section: Micro-xrf Mappingmentioning
confidence: 99%
“…17 μm diameter in spot size at 17.48 keV. Mapping of the samples with maximum excitation (tube: 50 kV, 600 μA), 2 ms measuring time per spot and step ranges between 20 to 50 μm leads to spatially resolved analytical data, with elements heavier than Na measurable under low vacuum conditions (Flude et al 2017). Mineral distribution maps were obtained by supervised classification using the "Spectral Angle Mapper" algorithm (Nikonow & Rammlmair 2017) .…”
Section: μ-Edxrfmentioning
confidence: 99%