2004
DOI: 10.1016/j.msea.2003.09.073
|View full text |Cite
|
Sign up to set email alerts
|

Application of energy-dispersive diffraction to the analysis of multiaxial residual stress fields in the intermediate zone between surface and volume

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
48
0
1

Year Published

2008
2008
2017
2017

Publication Types

Select...
6
4

Relationship

0
10

Authors

Journals

citations
Cited by 70 publications
(49 citation statements)
references
References 28 publications
0
48
0
1
Order By: Relevance
“…The measurements were used to evaluate the lattice spacing dðhkl; ; Þ by measuring the positions of TiN 200 reflections at an energy of about 28 keV as a function of the sample tilt angle ( Fig. 1) (Genzel et al, 2004). The dependence of the X-ray elastic strains were characterized using the sin 2 method by measuring lattice spacing dðhklÞ at different sample tilt angles along the direction of the diffraction vector Q.…”
Section: Synchrotron Energy Dispersive Xrdmentioning
confidence: 99%
“…The measurements were used to evaluate the lattice spacing dðhkl; ; Þ by measuring the positions of TiN 200 reflections at an energy of about 28 keV as a function of the sample tilt angle ( Fig. 1) (Genzel et al, 2004). The dependence of the X-ray elastic strains were characterized using the sin 2 method by measuring lattice spacing dðhklÞ at different sample tilt angles along the direction of the diffraction vector Q.…”
Section: Synchrotron Energy Dispersive Xrdmentioning
confidence: 99%
“…La principal diferencia en relación con el análisis mediante difracción de rayos X convencional es que la radiación sincrotrón es radiación X de alta energía, por lo que posee mayor poder de penetración permitiendo, además, la determinación de tensiones internas en volúmenes sensiblemente más pequeños. Se ha investigado el perfil de las tensiones residuales en una región adyacente a la superficie, con una profundidad de hasta unas 50 µm, utilizando el método puesto a punto por Genzel et al [14] . Mediante éste método, es posible determinar, para medidas realizadas a diferentes ángulos de la muestra en un plano perpendicular al plano de difracción, las tensiones a distintas profundidades a partir de la información suministrada por los diferentes picos de difracción.…”
Section: M Ma At Te Er Ri Ia Al Le Es S Y Y M Mé éT To Od Do Os Sunclassified
“…Residual stress depth distribution can be determined that way (see e.g. [12][13][14]). For the stress analysis of the welded joints also robust average values of the residual stress measures will be presented here.…”
Section: Residual Stress Analysis 23mentioning
confidence: 99%