Application of High Accelerated Life Testing for an Integrated Control Board

Yingying, Yuan; Zhang, Xuhui; Du, Shaohua; Peng, Zaiwu; Xiao, Xiaochun; Zuo, Jiani

doi:10.1007/978-981-10-7989-4_95

Lecture Notes in Electrical Engineering

2018

DOI: 10.1007/978-981-10-7989-4_95

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Application of High Accelerated Life Testing for an Integrated Control Board

Yuan Yingying¹,

Xuhui Zhang²,

Shaohua Du

et al.

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