Application of high-energy synchrotron radiation for texture studies

Mishin, Oleg; Lauridsen, E.M.; Lassen, N.C. Krieger; Brückner, G.; Tschentscher, Th.; Bay, B.; Jensen, D. Juul; Poulsen, Henning Friis

doi:10.1107/s0021889899016684

Cited by 28 publications

(17 citation statements)

References 18 publications

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“…[3][4][5][6][7][8] The strain heterogeneity was found to strongly affect texture in different layers of ECAEprocessed samples. [4][5][6] A similar situation during rolling, i.e., a strongly heterogeneous strain distribution producing substantially different textures, [9][10][11] has been shown to result in pronounced through-thickness variations of the rolled microstructure. [9,11] Considerable through-thickness variations of the microstructure are likely to be produced also by the ECAE process.…”

Section: Ov Mishin and Jr Bowenmentioning

confidence: 99%

Through-Thickness Variations of Deformed and Annealed Microstructures in ECAE-Processed Copper

Mishin

Bowen

2009

Metall Mater Trans A

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Section: Ov Mishin and Jr Bowenmentioning

confidence: 99%

Through-Thickness Variations of Deformed and Annealed Microstructures in ECAE-Processed Copper

Mishin

Bowen

2009

Metall Mater Trans A

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“…[55,58,59,60,61]. Hard x-ray studies of macroscopic and local textures were initiated at HASYLAB [58,62], and developed further by the groups of Bunge [63] and Wenk [64]. Characterization of the local stress and strain within bulk materials has been performed by numerous groups, using both energy-dispersive settings and monochromatic setups, e.g.…”

Section: Hard X-ray Work Using Synchrotron Sourcesmentioning

confidence: 99%

Methods for Mesoscale Structural Characterization

Poulsen

2004

Springer Tracts in Modern Physics

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As a motivation for introducing the 3DXRD method, this chapter contains a survey of the experimental methods conventionally used for structural characterization. The options for and limitations of studies on the mesoscale are discussed. The list of methods is not complete, but is intended to reflect the methods commonly used in materials science. This survey is followed by an account of the properties of hard x-raysdefined as x-rays with an energy of or above 50 keV -and the utilization of these at hard x-ray synchrotron beamlines. To put the development of the 3DXRD microscope into perspective, a brief account is given of the historical development of the use of such beamlines, with the prime focus initially on macroscale problems in condensed-matter physics. Electron and Optical MicroscopyThe predominant set of tools for structural characterization today belong to the family of electron microscopy (EM). Thanks to its atomic-scale resolution, transmission electron microscopy (TEM) is an indispensable tool for studies of dislocation structures, precipitates, interfaces and nanoscale structures in general [1]. Scanning electron microscopy (SEM) , on the other hand, offers relatively easy sample preparation, larger inspection areas and very userfriendly measurements, but at the cost of a spatial resolution of 1-50 nm [2].Within the last decade, SEM studies in combination with the automatic electron back-scattering pattern (EBSP) method [3,4,5,6] have become the workhorse for many metallurgical studies. The EBSP method, also known as EBSD, enables determination of the crystallographic orientation of selected local areas and reveals the microstructure by orientation contrast. When it is used in conventional SEMs, the spatial resolution is about 0.5-1 µm, whereas field-emission-gun SEMs may give resolutions as high as 50 nm [7]. A limitation for certain studies may be the angular resolution of the orientation determination, which presently is 0.5 0 -1 0 . Despite the enormous impact of EM, it is well recognized that using electrons as a probe is associated with a set of inherent disadvantages. Firstly, probing the elastic and plastic strain by EM is notoriously difficult. Secondly, the dynamical scattering processes involved complicate the process of structural refinement on the basis of diffraction data. Thirdly, the electrons penetrate ≤ 1 µm into materials, such that only the surface region is probed. This fact implies a number of limitations, which are central to this book. They are discussed in detail below.1. 2D characterization. The structural objects of interest, i.e. grains, dislocation structures, cracks, etc., are in general truly three-dimensional in nature. On the basis of observations from a single section, it is only possible to provide a 3D description by subjecting the objects to a statistical treatment. The discipline of stereology [8] was invented to facilitate such a description. However, it turns out that a number of parameters of interest simply cannot be inferred from a single 2D section without...

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“…In this case, sampling is provided by a single ω-scan. Another major advantage is that measurements of macroscopic texture and strain can be performed using exactly the same setup [2,3]. Hence, simultaneous characterization on several length scales is enabled.…”

Section: The Basic 3dxrd Setupmentioning

confidence: 99%

Geometric Principles

Poulsen¹

2004

Springer Tracts in Modern Physics

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Application of high-energy synchrotron radiation for texture studies

Cited by 28 publications

References 18 publications

Through-Thickness Variations of Deformed and Annealed Microstructures in ECAE-Processed Copper

Through-Thickness Variations of Deformed and Annealed Microstructures in ECAE-Processed Copper

Methods for Mesoscale Structural Characterization

Geometric Principles

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