Application of high-spatial-resolution secondary ion mass spectrometry for nanoscale chemical mapping of lithium in an Al-Li alloy

Xu, Xu; Jiao, Chengge; Li, Kexue; Hao, Min; Moore, Katie L.; Burnett, Timothy L.; Zhou, Xiaorong

doi:10.1016/j.matchar.2021.111442

Cited by 11 publications

(8 citation statements)

References 39 publications

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Section: Resultssupporting

confidence: 91%

“…The observations of intermetallic phases and the main phase are in accordance with the previous results . An FIB-SIMS analysis reveals segregation of Li at grain boundaries, which can be confirmed by BSE data . The identification of the different phases (Al 2 CuLi, T1), as described by Xu et al, is represented in the Supporting Information Figure S4.…”

Section: Resultssupporting

confidence: 90%

“…An FIB-SIMS analysis reveals segregation of Li at grain boundaries, which can be confirmed by BSE data . The identification of the different phases (Al 2 CuLi, T1), as described by Xu et al, is represented in the Supporting Information Figure S4. Magnesium was detected in high-resolution images, despite its low concentration (0.2%).…”

Section: Resultssupporting

confidence: 62%

“…Magnesium was detected in high-resolution images, despite its low concentration (0.2%). Xu et al 26 also estimate the grain boundaries to have a width of ∼90 nm. The composition of the main phase is much better spatially resolved in the FIB-SIMS results here than in EDX, showing that they are not homogeneous in composition but, rather, are made up of nanodomains ( Figure 9 c–e).…”

Section: Resultsmentioning

confidence: 99%

“…The Al−Li−Cu−Mg alloy sample material is prepared as described in Xu et al 26 Biosample: All chemicals were purchased from Sigma-Aldrich. Caco-2 cells were cultured and seeded on an insert (Millicell Hanging Inserts, PET 1 μm, 24-well plate).…”

Section: ■ Experimental Sectionmentioning

confidence: 99%

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Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging

et al. 2022

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The structural, morphological, and chemical characterization of samples is of utmost importance for a large number of scientific fields. Furthermore, this characterization very often needs to be performed in three dimensions and at length scales down to the nanometer. Therefore, there is a stringent necessity to develop appropriate instrumentational solutions to fulfill these needs. Here we report on the deployment of magnetic sector secondary ion mass spectrometry (SIMS) on a type of instrument widely used for such nanoscale investigations, namely, focused ion beam (FIB)–scanning electron microscopy (SEM) instruments. First, we present the layout of the FIB-SEM-SIMS instrument and address its performance by using specific test samples. The achieved performance can be summarized as follows: an overall secondary ion beam transmission above 40%, a mass resolving power ( M /Δ M ) of more than 400, a detectable mass range from 1 to 400 amu, a lateral resolution in two-dimensional (2D) chemical imaging mode of 15 nm, and a depth resolution of ∼4 nm at 3.0 keV of beam landing energy. Second, we show results (depth profiling, 2D imaging, three-dimensional imaging) obtained in a wide range of areas, such as battery research, photovoltaics, multilayered samples, and life science applications. We hereby highlight the system’s versatile capability of conducting high-performance correlative studies in the fields of materials science and life sciences.

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Section: Resultssupporting

confidence: 91%

Section: Resultssupporting

confidence: 90%

Section: Resultssupporting

confidence: 62%

Section: Resultsmentioning

confidence: 99%

Section: ■ Experimental Sectionmentioning

confidence: 99%

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