2012
DOI: 10.1117/12.922435
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Application of linear systems theory to characterize coherence scanning interferometry

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Cited by 15 publications
(12 citation statements)
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“…To the authors' knowledge, however, a spherical calibration artifact with suitable form deviation (subnanometer) is not commercially available. In previous work, a small mercury droplet deposited on glass was reported for this task since surface tension demands a spherical form to the required tolerance [18]. For routine calibration a more stable transferable artifact is required, and for this reason a calibration and adjustment protocol for CSI instrumentation based on measurements of silica microspheres was investigated.…”
Section: Measurement Of Psf/tf Characteristicsmentioning
confidence: 99%
“…To the authors' knowledge, however, a spherical calibration artifact with suitable form deviation (subnanometer) is not commercially available. In previous work, a small mercury droplet deposited on glass was reported for this task since surface tension demands a spherical form to the required tolerance [18]. For routine calibration a more stable transferable artifact is required, and for this reason a calibration and adjustment protocol for CSI instrumentation based on measurements of silica microspheres was investigated.…”
Section: Measurement Of Psf/tf Characteristicsmentioning
confidence: 99%
“…Recently, the application of similar ideas to cases where large strongly scattering objects are being imaged was attempted by the authors of [3][4][5], with apparent success, and this work has subsequently been considered as a possible route by which coherence scanning interferometers (CSIs) could be calibrated [4][5][6][7][8][9][10], or inform us about the imaging process [11][12][13][14][15][16][17][18][19][20][21].…”
Section: Introductionmentioning
confidence: 99%
“…Since the PSF is realistically strongly dependent on system aberrations, such information is key for accurate data analysis and system benchmarking Correspondence to: Matthew R. Foreman, Blackett Laboratory, Department of Physics, Imperial College London, Prince Consort Road, South Kensington, London, SW7 2BZ, UK. Tel: +44 (0)20 7594 7721; fax: +44 (0)20 7594 7714; e-mail: matthew.foreman@imperial.ac.uk (Cotte et al, 2010;Stallinga & Rieger, 2010;Cole et al, 2011;Mandal et al, 2012;Quirin et al, 2012).…”
Section: Introductionmentioning
confidence: 99%
“…Localization accuracy in localization microscopy is, for example, highly dependent on the assumed point spread function (PSF) used for data fitting. Since the PSF is realistically strongly dependent on system aberrations, such information is key for accurate data analysis and system benchmarking (Cotte et al, 2010;Stallinga & Rieger, 2010;Cole et al, 2011;Mandal et al, 2012;Quirin et al, 2012).…”
Section: Introductionmentioning
confidence: 99%