2017
DOI: 10.1109/jphot.2017.2698409
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Application of Particle Filter to On-board life estimation of LED lights

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Cited by 9 publications
(5 citation statements)
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References 19 publications
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“…To forecast the lumen maintenance life of LEDs, Fan et al (2015) developed a nonlinear filtering prediction approach based on Sequential Monte Carlo (SMC) and Bayesian dynamic recursive particle filter (PF). Investigating the remaining useful life (RUL) of airport ground lighting (AGL), Ruknudeen and Asokan (2017) employed PF and onboard diagnostics to determine L70. Enayati et al (2021) devised a probability density function (PDF) for LED life prediction using the Monte Carlo algorithm (MC) and Nonlinear Kalman filter (IEKF).…”
Section: Filtering Networkmentioning
confidence: 99%
“…To forecast the lumen maintenance life of LEDs, Fan et al (2015) developed a nonlinear filtering prediction approach based on Sequential Monte Carlo (SMC) and Bayesian dynamic recursive particle filter (PF). Investigating the remaining useful life (RUL) of airport ground lighting (AGL), Ruknudeen and Asokan (2017) employed PF and onboard diagnostics to determine L70. Enayati et al (2021) devised a probability density function (PDF) for LED life prediction using the Monte Carlo algorithm (MC) and Nonlinear Kalman filter (IEKF).…”
Section: Filtering Networkmentioning
confidence: 99%
“…However, the PoF methods [178][179][180][181][182][183] require comprehensive knowledge of products in advance (e.g., materials and geometries, thermal, electrical, mechanical, life-cycle conditions, and other processes that lead to failures) that always increases the time and cost in actual applications. On the other hand, the data-driven approaches [119,126,[184][185][186][187][188][189][190][191][192][193][194] need sufficient measurement or experimental data to estimate the health conditions and to predict trend thresholds from failure prognostics, but it is not easy to obtain these data in advance, especially for newly introduced LED lighting products. Thus, the fusion-based PHM is believed to solve these concerns by combining the advanced qualities and features of both the PoF and DD approaches.…”
Section: Fusion Prognostics Approach For Light-emitting Diodesmentioning
confidence: 99%
“…The filtering and smoothing methods introduced above will be repeated iteratively twice to get the real degradation of the SV. In this paper, two degradation models are selected to estimate the degradation process of the SVs: the exponential model [29] and the Stochastic process model [30]. This means that real degradation will be defined as the measurement in the degradation model described above.…”
Section: Rul Estimation Of the Sv Based On Apf Techniquementioning
confidence: 99%