Application of the dual‐beam FIB/SEM to metals research

Sivel, V. G. M.; Brand, J. Va N Den; Wang, W. R.; Mohdadi, H.; Tichelaar, F.D.; Alkemade, P.F.A.; Zandbergen, H.W.

doi:10.1111/j.0022-2720.2004.01329.x

Cited by 55 publications

(26 citation statements)

References 20 publications

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“…The ion beam slices materials with the spacing of several tens of nanometers, additionally, fiduciary marks are produced as reference points of the image alignment, and the sectioned image taken by the e-beam has a submicron scale of lateral spatial resolution [78,62]. Therefore, the integration of electron and ion beams provides a useful tool for 3D inspection of pore structure, buried defects or metrology [79,80], whereas, the conventional SEM is restricted to 2D surface analysis.…”

Section: Focused Ion Beam/ Scanning Electron Microscopy (Fib/sem)mentioning

confidence: 99%

Effect of Cathode Microstructure on the Cathode Polarization in the Sintered Strontium-Doped Lanthanum Manganite/Yttria Stabilized Zirconia Solid Oxide Fuel Cells

et al. 2008

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Section: Focused Ion Beam/ Scanning Electron Microscopy (Fib/sem)mentioning

confidence: 99%

Effect of Cathode Microstructure on the Cathode Polarization in the Sintered Strontium-Doped Lanthanum Manganite/Yttria Stabilized Zirconia Solid Oxide Fuel Cells

et al. 2008

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“…The threedimensional details of the material internal structure (hereafter generically referred to as the material microstructure) are often richly complex and span a multitude of length scales [20][21][22][23][24][25][26][27][28][29][30][31][32][33][34][35][36]. These details play a pivotal role in controlling the material's overall multifunctional performance characteristics.…”

Section: Introductionmentioning

confidence: 99%

Computationally Efficient, Fully Coupled Multiscale Modeling of Materials Phenomena Using Calibrated Localization Linkages

Kalidindi

2012

ISRN Materials Science

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Most modern physics-based multiscale materials modeling and simulation tools aim to take into account the important details of the material internal structure at multiple length scales. However, they are extremely computationally expensive. In recent years, a novel data science enabled framework has been formulated for effective scale-bridging that is central to practical multiscaling. A salient feature of this new approach is its ability to capture heterogeneity of fields of interest at different length scales. In this approach, the computations at the mesoscale are handled using a novel data science approach called materials knowledge systems (MKS). The MKS approach has enjoyed tremendous success in building highly accurate and computationally efficient metamodels for localization (i.e., mesoscale spatial distribution of a macroscale imposed field such as stress or strain rate) in simulating a number of different multiscale materials phenomena. MKS derives its accuracy from the fact that it is calibrated to results from previously established numerical models for the phenomena of interest, while its computational efficiency comes from the use of fast Fourier transforms. The current capabilities and the future outlook for the MKS framework are expounded in this paper.

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“…[6,7] In one study, an epoxy-coated aluminium substrate was milled using FIB (accelerating voltage of 30 keV, ion current of 20 nA) for preparing TEM samples. [14] The paper does not consider possible damage in the residual polymer, however. At least four consequences of the application of FIB for polymer sample preparation are to be addressed in that respect:…”

Section: Introductionmentioning

confidence: 99%

Focused ion beam irradiation: morphological and chemical evolution in epoxy polymers

Kochumalayil

Meiser

Soldera

et al. 2009

Surface & Interface Analysis

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This work contributes to the understanding of focused ion beam (FIB) technology for polymers. The conditions of treatment are varied, in particular by etching under 'dry' ultra-high vacuum conditions or in the presence of water vapour. For a glassy epoxy network, the changes in chemistry and morphology are characterised. Energy-dispersive X-ray analysis reveals that gallium is always implanted in the epoxy but the content is higher in the case of 'dry' FIB milling. According to attenuated total reflection infrared micro-spectroscopy, new chemical structures form in the surface region of the epoxy during FIB milling with or without water vapour. Scanning electron microscopy and scanning force microscopy were used to image the topography of the etched epoxy surfaces. Quite smooth surfaces result under 'dry' etching conditions. In the presence of water vapour, rough surfaces with a sub-micrometre globular morphology are obtained. This is an indication of the heterogeneous morphology of the epoxy polymer. As compared to 'dry' conditions, the introduction of water vapour during FIB milling increases the milling yield significantly. As a result, the FIB treatment changes the chemistry and the structure of the epoxy network not only at the very surface but also in some significant surface layer of the sample. It can be expected that such a modified zone will also form on other cross-linked polymers.

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Application of the dual‐beam FIB/SEM to metals research

Cited by 55 publications

References 20 publications

Effect of Cathode Microstructure on the Cathode Polarization in the Sintered Strontium-Doped Lanthanum Manganite/Yttria Stabilized Zirconia Solid Oxide Fuel Cells

Effect of Cathode Microstructure on the Cathode Polarization in the Sintered Strontium-Doped Lanthanum Manganite/Yttria Stabilized Zirconia Solid Oxide Fuel Cells

Computationally Efficient, Fully Coupled Multiscale Modeling of Materials Phenomena Using Calibrated Localization Linkages

Focused ion beam irradiation: morphological and chemical evolution in epoxy polymers

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