2004
DOI: 10.1063/1.1759795
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Application of the pressure wave propagation method for adhesion defects detection in very thin multilayer structures

Abstract: Recently it was shown that the pressure wave propagation method, usually used to study electrical behavior of dielectric materials, can be applied to the nondestructive detection and quantitative analysis of adhesion defects in bilayer structures. In this paper, we investigate the possibilities open by the same method to detect and quantify adhesion defects in trilayer structures. After a brief recall of the principle of the method and of the main results obtained for bilayer structures, we describe the trilay… Show more

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“…Many other works have been carried out for ultrasonic characterization of the interfacial weakness in multilayered structures. 22,23 Due to the complex wave propagation behavior in multilayered systems, however, it is not a straightforward task to identify the interfacial stiffness from a limited number of observations.…”
Section: Introductionmentioning
confidence: 99%
“…Many other works have been carried out for ultrasonic characterization of the interfacial weakness in multilayered structures. 22,23 Due to the complex wave propagation behavior in multilayered systems, however, it is not a straightforward task to identify the interfacial stiffness from a limited number of observations.…”
Section: Introductionmentioning
confidence: 99%