Application of Various Fault Localization Techniques to Different Types of 6T-SRAM Column Failures

Abstract

In this paper, we demonstrate different techniques of fault isolation from front-side of 6T-SRAM column failures. We show how to choose proper and suitable methods to solve column failures with a variety of characteristics. The capabilities and physical mechanisms of OBIRCH, photoemission microscope and LCA are reviewed utilizing these SRAM column failures.