Application of XPS imaging analysis in understanding interfacial delamination and X‐ray radiation degradation of PMMA

Abstract

The recent development of X‐ray Photoelectron Spectroscopy (XPS) instrumentation with spatial resolution down to several microns has advanced the capability of elemental and chemical state imaging. XPS imaging analysis has been applied in understanding the delamination problems of siloxane coatings on polymethyl‐methacrylate (PMMA) polymer. It was found that delamination occurred by interfacial failure, and the coating suffered complete delamination from a PMMA substrate. This example offered an opportunity for the investigation of X‐ray damage on polymers encountered in XPS imaging analysis. This paper also demonstrated how to construct a constrained peak model with the aid of chemical knowledge and supporting evidence of the sample. Monte Carlo error analysis was used to determine the validity of the peak fit models used. Copyright © 2013 John Wiley & Sons, Ltd.

Application of quantitative X‐ray photoelectron spectroscopy (XPS) imaging: investigation of Ni‐Cr‐Mo alloys exposed to crevice corrosion solution

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ToF-SIMS analysis of a polymer microarray composed of poly(meth)acrylates with C6derivative pendant groups

“…In order to achieve surface analysis of high‐throughput systems the method must be automated such that hundreds to thousands of measurements can be acquired without generating a bottle‐neck within the high‐throughput materials development cycle. Automated surface analysis of large sample sets has been achieved for water contact angle measurements, X‐ray photoelectron spectroscopy, atomic force microscopy, surface plasmon resonance and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) . ToF‐SIMS has been widely used for studying polymeric systems, and when coupled with multivariate analysis has proven to be particularly useful for establishing correlations between the surface chemistries of a library of materials with various properties such as water contact angle and cell attachment .…”

Imaging XPS for industrial applications

“…Taken with the evidence of poor Au coverage and the presence of chlorine, it suggests a corrosive agent has etched the metallic stack. This can be confirmed by another strength of the developments in processing of XPS image data; the ability to categorise regions by a false colour image and sum spectra according to colour classification after PCA reduction has been applied [7,22,46] and shown in figure 4. From the reconstructed spectra shown in figure 4(c) -(e) it is evident that the underlying chemical states varying in each distinct area.…”