2001
DOI: 10.1107/s0108767301006985
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Applications of dynamical diffraction under locally plane wave conditions: defects in nearly perfect crystals and X-ray refractometry

Abstract: In a previous paper, the concept of a locally plane wave was explained theoretically. In such a configuration, the fringe pattern recorded on the film can be considered as a phase analyser. Here the experimental analysis is presented, showing examples of interesting applications to X-ray refractometry and to the visualization of the strain field around isolated defects.

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Cited by 6 publications
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References 23 publications
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