1993
DOI: 10.1111/j.1365-2818.1993.tb03348.x
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Applications of medium‐voltage STEM for the 3‐D study of organelles within very thick sections

Abstract: can be visualized through thick sections (several micro-Scanning transmission electron microscopy at 300 kV enables the visualization of nucleolar silver-stained structures within thick sections (3-8pm) of Epon-embedded cells at high tilt angles (-50"; + 50"). Thick sections coated with gold particles were used to determine the best conditions for obtaining images with high contrast and good resolution. For a 6-pm-thick section the values of thinning and shrinkage under the beam are 35 to 10% respectively. At … Show more

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Cited by 25 publications
(26 citation statements)
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“…Sections 1000 to 2000 nm thick were obtained, and no counterstaining was performed to analyze the silver deposits more easily (Beorchia et al, 1992). These sections were studied at 200 kV in a 200 CX electron microscope and images were obtained on negatives.…”
Section: Ultrastructural Localization Of Ag-nor Proteinsmentioning
confidence: 99%
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“…Sections 1000 to 2000 nm thick were obtained, and no counterstaining was performed to analyze the silver deposits more easily (Beorchia et al, 1992). These sections were studied at 200 kV in a 200 CX electron microscope and images were obtained on negatives.…”
Section: Ultrastructural Localization Of Ag-nor Proteinsmentioning
confidence: 99%
“…For the high-resolution tomographic studies, 3000-nm-thick sections were observed in a medium-voltage electron microscope working at 300 kV in the scanning and transmission electron microscope (STEM) mode (CM 30 Philips, Eindhoven, The Netherlands) as previously described (Beorchia et al, 1992). The specimen holder was mounted on a eucentric goniometer stage that can be tilted from Ϫ60°to ϩ60°.…”
Section: Ultrastructural Localization Of Ag-nor Proteinsmentioning
confidence: 99%
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“…All ultrathin sections were observed with a 200 CX electron microscope at 100 kV (JEOL). Sections 0.5 m or 2 m in thickness were observed in a medium voltage CM30 electron microscope working at 250 kV in the STEM mode (Philips), as described previously (Beorchia et al 1992;Héliot et al 1997;Cheutin et al 2002). Before starting a tilt series, the whole-mounted cells were irradiated for 10 min at 100 e Ϫ /(Å 2 ϫ sec).…”
Section: Electron Microscopymentioning
confidence: 99%
“…After acquiring a series of optical sections by confocal microscopy or collecting projections at different angles with a scanning and transmission electron microscope (STEM), volume reconstructions and tomographic analyses were performed (Beorchia et al 1992;Lucas et al 1996;Héliot et al 1997;Perkins et al 1997;Baumeister et al 1999;Cheutin et al 2002;Frank et al 2002). The results reveal both the fine localization and the different levels of organization of pKi-67.…”
mentioning
confidence: 99%