2017
DOI: 10.1080/17452759.2017.1357319
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Applications of non-destructive testing techniques for post-process control of additively manufactured parts

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Cited by 81 publications
(37 citation statements)
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“…A porous silica cubic sample with 20 layers ( Figure 10 ) was successfully fabricated via SLS followed by furnace sintering, and the relative density was only 46.8%. Firstly, the silica sample was evaluated by visual inspection since it is quick, simple, and cheap to perform to most specimens [ 26 ], and the sample showed a porous-like and crack-free surface. Defects such as cracks were not observed in the cross-section of the sample ( Figure 10 c).…”
Section: Resultsmentioning
confidence: 99%
“…A porous silica cubic sample with 20 layers ( Figure 10 ) was successfully fabricated via SLS followed by furnace sintering, and the relative density was only 46.8%. Firstly, the silica sample was evaluated by visual inspection since it is quick, simple, and cheap to perform to most specimens [ 26 ], and the sample showed a porous-like and crack-free surface. Defects such as cracks were not observed in the cross-section of the sample ( Figure 10 c).…”
Section: Resultsmentioning
confidence: 99%
“…As a remedy for porosity in the as-built alloys, hot isostatic pressing (HIP) is always performed at high temperatures and high pressures for a couple of hours after AM processing in order to close and eliminate internal voids [ 19 ]. HIP can be regarded as a homogenization process performed in the single-phase field at a very high temperature.…”
Section: Grain Morphology Controlmentioning
confidence: 99%
“…Furthermore, the annular array PAUT possesses similar detection accuracy, regardless the ultrasonic incident detection on deposition surface or printing surface of the AM titanium specimen. It is known that the minimal detectable defect size is closely determined by the wavelength the wavelength of the ultrasound, which varies inversely with the frequency of the probe as the speed of ultrasound is constant in a specific material [23]. In particular when the defect size is close to half-wavelength, there will be significant diffraction phenomenon accompanied with negligible reflected echo.…”
Section: Forming Orientation Dependence Of Annular Array Pautmentioning
confidence: 99%