1995
DOI: 10.1051/jp4:1995102
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Applications of Positron Annihilation Spectroscopy

Abstract: We describe the application of Positron Annihilation Spectroscopy (PAS) to some selected technologically important systems. The method involves a nondestructive probe to detect low levels of open-volume defects. The discussion shows the application of PAS to a wide range of advanced material systems.

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Cited by 5 publications
(4 citation statements)
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“…The experimental work that provides the best estimate of stable Frenkel pair production involves cryogenic irradiation and subsequent annealing while measuring a parameter such as electrical resistivity. 26,27 Less direct experimental measurements include small angle neutron scattering, 28 X-ray scattering, 29 positron annihilation spectroscopy, 30 and field ion microscopy. 31 More broadly, transmission electron microscopy (TEM) has been used to characterize the small point defect clusters such as microvoids, dislocation loops, and stacking fault tetrahedra that are formed as the cascade collapses.…”
Section: Computational Approach To Simulating Displacement Cascadesmentioning
confidence: 99%
“…The experimental work that provides the best estimate of stable Frenkel pair production involves cryogenic irradiation and subsequent annealing while measuring a parameter such as electrical resistivity. 26,27 Less direct experimental measurements include small angle neutron scattering, 28 X-ray scattering, 29 positron annihilation spectroscopy, 30 and field ion microscopy. 31 More broadly, transmission electron microscopy (TEM) has been used to characterize the small point defect clusters such as microvoids, dislocation loops, and stacking fault tetrahedra that are formed as the cascade collapses.…”
Section: Computational Approach To Simulating Displacement Cascadesmentioning
confidence: 99%
“…The results were analyzed in terms of the so-called S parameter, which is defined as the area under the central part of the annihilation photopeak divided by the total area, and it is a measure of the electron momentum distribution at the annihilation site. 1,5 The vacancy-type defects act as trapping sites for positrons and annihilation with low energy valence electrons at these defects results in a narrowing of the photopeak corresponding to an increase in the S parameter.…”
mentioning
confidence: 99%
“…These gamma quanta hold information about the electronic environment around the annihilation site. 1 The binary FeSi phase diagram 2 is shown in Fig. 1.…”
mentioning
confidence: 99%
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