2023
DOI: 10.1021/acs.chemrev.3c00364
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Applications of Transmission Electron Microscopy in Phase Engineering of Nanomaterials

Guanxing Li,
Hui Zhang,
Yu Han
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Cited by 15 publications
(2 citation statements)
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“…The difference in symmetry between the octahedrally coordinated 1T-MoSe 2 and the trigonally coordinated 2H-MoSe 2 crystal structures (shown in Figure f,g) was directly observed using high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM), and this technique directly showed the difference in atomic arrangements between 2H-MoSe 2 and 1T-MoSe 2 . An atomically resolved HAADF-STEM image of 1T-MoSe 2 showed zigzag chains (Figure h) that were consistent with previously reported observations. , Energy-dispersive X-ray (EDS) mapping images (Figure i) showed the uniform distribution of Mo, Se, Ce, and O elements within the MoSe 2 /CeO 2 composite.…”
Section: Resultssupporting
confidence: 86%
“…The difference in symmetry between the octahedrally coordinated 1T-MoSe 2 and the trigonally coordinated 2H-MoSe 2 crystal structures (shown in Figure f,g) was directly observed using high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM), and this technique directly showed the difference in atomic arrangements between 2H-MoSe 2 and 1T-MoSe 2 . An atomically resolved HAADF-STEM image of 1T-MoSe 2 showed zigzag chains (Figure h) that were consistent with previously reported observations. , Energy-dispersive X-ray (EDS) mapping images (Figure i) showed the uniform distribution of Mo, Se, Ce, and O elements within the MoSe 2 /CeO 2 composite.…”
Section: Resultssupporting
confidence: 86%
“…The electron beam passes through the sample, where some of the electrons are scattered or absorbed, while others are transmitted to a detector to produce a two-dimensional image of the internal structure of the sample. It combines inverse spatial diffraction, real-space imaging, and spectroscopic techniques for comprehensive characterization in the domains of time, space, momentum, and increasingly, energy, with excellent resolution [ 69 ]. SEM typically has a low resolution, generally in the nanometer to sub-nanometer range, while TEM, on the other hand, provides high-resolution images [ 47 ] that can reach sub-nanometer to atomic levels.…”
Section: Detection Techniques For Mps In Porous Mediamentioning
confidence: 99%