2008 IEEE 9th VLSI Packaging Workshop of Japan 2008
DOI: 10.1109/vpwj.2008.4762192
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Applied optimization of black oxide flat heat spreader for low-k molded flip chip packages

Abstract: The most important factor associated with cracking phenomenon during reflow soldering and molding are delamination at the interface of component material of packages. Copper has been widely used as substrate and leadframe as it has good thermal performance. However, Copper swface exposed to environment leading to weak interface bond with polymeric adhesive and encapsulant. Black oxide is a conversion coating applied onto the copper to improve its interfacial adhesion with polymeric adhesives. In this paper we … Show more

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