Gd-, Y-, and La-doped CeO 2 films (Gd 0.2-Ce 0.8 O 2 , Y 0.2 Ce 0.8 O 2 , and La 0.2 Ce 0.8 O 2 ) are prepared on Ni-W tapes and La 2 Zr 2 O 7 -buffered Ni-W tapes using solgel method. The films are characterized by X-ray diffraction and atomic force microscopy. Results indicate that Y 0.2 Ce 0.8 O 2 (YCO) film shows the better crystallinity and the surface quality compared with Gd 0.2 Ce 0.8 O 2 (GCO) and La 0.2 Ce 0.8 O 2 (LCO) films. The YCO buffer layer has good in-plane texture with purely c-oriented grains. The YCO films deposited on La 2 Zr 2 O 7 (LZO) also demonstrate the good texture and the perfect surface quality. YBCO films are prepared on the YCO/LZO and LCO/LZO composite buffer layers through the low fluorine solution route. The YBCO film deposited on the YCO/LZO buffer layer displays a high T c of 89.6 K with a low transition temperature width (DT = 0.45 K), and a J c value of 0.5 MA/cm 2 , which is superior to that deposited on LCO/LZO buffer layer. Graphical Abstract Gd-, Y-, and La-doped CeO 2 films (Gd 0.2 Ce 0.8 O 2 , Y 0.2 Ce 0.8 O 2 , and La 0.2 Ce 0.8 O 2 ) are prepared on Ni-W tapes through sol-gel method. GCO film has a coarse surface, and the YCO film has the best texture and surface quality. Y 0.2 Ce 0.8 O 2 /La 2 Zr 2 O 7 and La 0.2 Ce 0.8 O 2 / La 2 Zr 2 O 7 composite buffer layers are also prepared and compared. The surface quality of Y 0.2 Ce 0.8 O 2 /La 2 Zr 2 O 7 is superior to that of La 0.2 Ce 0.8 O 2 /La 2 Zr 2 O 7 composite buffer layer. High-T c YBCO films with sharp DT = 0.45 K and a J c value of 0.5 MA/cm 2 are successfully obtained on the Y 0.2 Ce 0.8 O 2 /La 2 Zr 2 O 7 film, which is superior to that on La 0.2 Ce 0.8 O 2 /La 2 Zr 2 O 7 buffer layer.