2020
DOI: 10.1038/s41598-020-73880-w
|View full text |Cite
|
Sign up to set email alerts
|

Aqueous ionic effect on electrochemical breakdown of Si-dielectric–electrolyte interface

Abstract: The breakdown of thin dielectric films (SiO2, Si3N4, HfO2) immersed in aqueous electrolyte was investigated. The current and the kinetics of dielectric breakdown caused by large cathodic electric field applied across the dielectric layer reveal the electrochemical nature of dielectric materials. Electrolytes play a huge role in the established dielectric-electrolyte interface with respect to the overall electrical behavior of the system. Although aqueous cations are considered as spectator ions in most electro… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
8
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
4

Relationship

2
2

Authors

Journals

citations
Cited by 4 publications
(8 citation statements)
references
References 46 publications
0
8
0
Order By: Relevance
“…As these models are based on a solid phase, the interfacing electrolyte solution should be reflected in the EOS system. As shown in Figure 2, the potential diagram of the silicon oxide was revisited with the effect of cationic species considered; thus, the potential of DB (V DB ) is driven predominantly by ion desolvation [16] . The electrical conduction pathway is rationalized using the percolation model, leading to thermal damage upon Joule heating during DB [15,34,35] .…”
Section: Fundamental Understanding Of Electron Transfer Pathways In Silicon Oxide Dielectric Layers In Electrolyte Solutionsmentioning
confidence: 99%
See 4 more Smart Citations
“…As these models are based on a solid phase, the interfacing electrolyte solution should be reflected in the EOS system. As shown in Figure 2, the potential diagram of the silicon oxide was revisited with the effect of cationic species considered; thus, the potential of DB (V DB ) is driven predominantly by ion desolvation [16] . The electrical conduction pathway is rationalized using the percolation model, leading to thermal damage upon Joule heating during DB [15,34,35] .…”
Section: Fundamental Understanding Of Electron Transfer Pathways In Silicon Oxide Dielectric Layers In Electrolyte Solutionsmentioning
confidence: 99%
“… The diagrams of the DB occurring at the silicon oxide dielectric layer. (a) The potential diagram along with the silicon oxide with or without the effect of cations [16] . (b) The percolation model [34] …”
Section: Fundamental Understanding Of Electron Transfer Pathways In Silicon Oxide Dielectric Layers In Electrolyte Solutionsmentioning
confidence: 99%
See 3 more Smart Citations