Ney Poovan banana, the most widely cultivated mixed diploid banana, has been reported to be susceptible to Fusarium wilt like many other varieties in the world. The identification of natural variants possessing disease tolerance or resistance is one strategy to prevent losses. The aim of this study was to identify resistant lines in Ney Poovan banana, through extensive field surveys and screening of putative variants using a detached leaf-based challenging technique. The selected lines were screened under field condition to determine their economic feasibility for commercial-scale use. A total of 26 lines were observed to be resistant to the disease, out of which 24 exhibited a commercially acceptable productivity index and five best lines possessing desirable attributes were obtained.