The
initial growth during the atomic-layer deposition (ALD) of
Al
2
O
3
using trimethylaluminum (TMA) and water
was studied on two starting surfaces: SiO
2
and −H-terminated
Si(111) [H/Si(111)]. In situ spectroscopy ellipsometry (SE) showed
virtually immediate growth of Al
2
O
3
on both
surfaces, although for H/Si(111) a reduced growth-per-cycle was observed
in the initial 20 cycles. The underlying surface chemistry during
the initial cycles of ALD was monitored with in situ broadband sum-frequency
generation (BB-SFG) spectroscopy. For the SiO
2
surface,
the −CH
3
surface groups were followed revealing
that only the first TMA half-cycle deviates from the steady-growth
regime. The reaction cross section of the initial TMA half-cycle (σ
TMA
= 2.0 ± 0.2 × 10
–18
cm
2
) was a factor of 3 lower than the cross section of the TMA
half-cycle during the steady-growth regime of ALD (σ
TMA
= 6.5 ± 0.6 × 10
–18
cm
2
).
All H
2
O half-cycles, including the first, showed steady-growth
behavior with a corresponding reaction cross section (σ
H
2
O
= 4.0 ± 0.4 × 10
–20
cm
2
). Therefore, only the first ALD cycle was affected
by initial growth effects on the SiO
2
starting surface,
in line with the SE data. For the H/Si(111) surface, the Si–H
groups were monitored with BB-SFG spectroscopy, revealing a reaction
cross section of σ
TMA
= 3.1 ± 0.3 × 10
–18
cm
2
for the first TMA half-cycle on H/Si(111);
a factor two lower than that during the steady regime of Al
2
O
3
. These results demonstrate that the chemistry during
the initial growth regime of Al
2
O
3
ALD on SiO
2
and H/Si(111) shows subtle but measurable differences compared
to the steady-growth regime.