1999
DOI: 10.1063/1.123968
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Argon ion-induced dissociation of acetylene in an expanding Ar/C2H2 plasma

Abstract: Mass spectrometric and Langmuir probe measurements reveal that the plasma chemistry of an expanding Ar/C2H2 plasma which is used for deposition of hydrogenated amorphous carbon is dominated by argon ion-induced dissociation of the precursor gas. The ion-induced dissociation is very efficient leading to complete depletion under certain conditions. The ion fluence as determined from modeling the mass spectrometry results is in good agreement with Langmuir probe measurements suggesting a one-to-one relation betwe… Show more

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Cited by 37 publications
(31 citation statements)
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“…A comparative study shows C 2 H 2 as a better candidate over CH 4 and C 6 H 6 , which reveals that chemistry plays an important role during deposition even under such conditions. 4,[17][18][19][20] Studies dedicated to reaction mechanism involved in such plasmas have been taken up by our group at several occasions. 1 Depositing a-C:H films at high growth rates without compromising the material quality has been a scientific and technological challenge, where the expanding thermal plasma chemical vapor deposition ͑ETP-CVD͒ has emerged as a promising technique.…”
Section: Introductionmentioning
confidence: 99%
“…A comparative study shows C 2 H 2 as a better candidate over CH 4 and C 6 H 6 , which reveals that chemistry plays an important role during deposition even under such conditions. 4,[17][18][19][20] Studies dedicated to reaction mechanism involved in such plasmas have been taken up by our group at several occasions. 1 Depositing a-C:H films at high growth rates without compromising the material quality has been a scientific and technological challenge, where the expanding thermal plasma chemical vapor deposition ͑ETP-CVD͒ has emerged as a promising technique.…”
Section: Introductionmentioning
confidence: 99%
“…These films were obtained by means of the Ar-fed expanding thermal plasma (ETP) technique, a remote plasma where the electron temperature drops to about 0.3 eV [14] in the downstream region, and the plasma chemistry is dominantly controlled by charge exchange reactions between Ar + and precursor molecules, followed by dissociative recombination of the molecular ions with lowenergy electrons [15,16]. The deposited films showed a k value as low as 2.8 (measured at 1 MHz), and hardness and Young's modulus values of 0.9 GPa and 7.1 GPa, respectively.…”
Section: Introductionmentioning
confidence: 99%
“…The combination of mass spectrometry and Langmuir probe measurements revealed the dominance of the argon ion induced dissociation of injected acetylene. 17 The proposed mechanism for the plasma chemistry starts with a charge transfer reaction between an argon ion and an acetylene molecule 18 Ar ϩ ϩC 2 H 2 →ArϩC 2 H 2 ϩ, *…”
Section: Introductionmentioning
confidence: 99%