2013
DOI: 10.1080/00207543.2013.857056
|View full text |Cite
|
Sign up to set email alerts
|

ARMAX model based run-to-run fault diagnosis approach for batch manufacturing process with metrology delay

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
15
0

Year Published

2015
2015
2022
2022

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 21 publications
(15 citation statements)
references
References 26 publications
0
15
0
Order By: Relevance
“…Importantly, the nearly 5-fold increase in enzyme activity seen at 20 nM of DNA-Disc agrees with the enhancement seen in previous studies where caspase-9 was dimerized on a DNA origami-based nanoscaffold at roughly the same caspase-9 concentration, 34 or with other in vitro systems that typically do not reach the activity of apoptosome activated caspase-9. [31][32][33]35 A further increase in DNA-Disc concentration, beyond the optimum, diminished enzyme activity ( Fig. 2a), which can be attributed to combinatorial inhibition.…”
mentioning
confidence: 98%
“…Importantly, the nearly 5-fold increase in enzyme activity seen at 20 nM of DNA-Disc agrees with the enhancement seen in previous studies where caspase-9 was dimerized on a DNA origami-based nanoscaffold at roughly the same caspase-9 concentration, 34 or with other in vitro systems that typically do not reach the activity of apoptosome activated caspase-9. [31][32][33]35 A further increase in DNA-Disc concentration, beyond the optimum, diminished enzyme activity ( Fig. 2a), which can be attributed to combinatorial inhibition.…”
mentioning
confidence: 98%
“…Dendrimers and proteins have be reported as building blocks for the construction of supramolecular polymers by other host–guest interactions. Wang and Kaifer reported that viologen‐containing dendrimers could be efficiently dimerized by one‐electron reduction in the presence of a CB[8] host .…”
Section: Cucurbit[8]uril‐based Polymersmentioning
confidence: 99%
“…It is a schema abstraction of mathematical models or physical models of processes and devices. Fault diagnosis based on SDG is based on the strong expression ability of nodes and directed edges in the SDG model, and its unique reasoning method can be used for fault detection and location quickly and effectively [5,6,7].…”
Section: Introductionmentioning
confidence: 99%