Nanoscale ferromagnetic entities are directly patterned in superparamagnetic Fe–Cr layers by interfering laser beams. To characterize the formed entities, in addition to the conventional methods, we used a technique for magnetic imaging based on the atomic force microscopy (AFM) with nonmagnetic tips and an ac magnetic field applied in situ. The observed AFM dynamic response is interpreted in terms of magnetostriction and a related quantity, the ac susceptibility.