1990
DOI: 10.1002/qre.4680060408
|View full text |Cite
|
Sign up to set email alerts
|

Arrhenius and the temperature dependence of non‐constant failure rate

Abstract: This paper examines the temperature dependence of component hazard rate for the cases of log-normal and Weibull failure-time distributions and shows that the common belief that the temperature variation of component failure rate follows the Arrhenius rule can be substantially in error. Although most failures in present-day equipment are not due to defective components, the paper also examines the temperature dependence of equipment rate of occurrence of failure having a power-law or negative exponential variat… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
10
0

Year Published

1991
1991
2019
2019

Publication Types

Select...
5
2
1

Relationship

0
8

Authors

Journals

citations
Cited by 24 publications
(10 citation statements)
references
References 9 publications
0
10
0
Order By: Relevance
“…Blanks [30] in a similar vein has questioned the validity of the Arrhenius relation when nonconstant failure rates prevail. He suggests that the temperature-dependent rate of equipment failure is less than that predicted by the Arrhenius AF when the hazard rate decreases with time.…”
Section: Is Arrhenius Erroneous?mentioning
confidence: 99%
“…Blanks [30] in a similar vein has questioned the validity of the Arrhenius relation when nonconstant failure rates prevail. He suggests that the temperature-dependent rate of equipment failure is less than that predicted by the Arrhenius AF when the hazard rate decreases with time.…”
Section: Is Arrhenius Erroneous?mentioning
confidence: 99%
“…The Arrhenius law is a widespread model in the electronic packaging industry to relate failure rate and temperature [9]. We assume that the junction temperature of the module in the center represents the average junction temperature of the modules on PWB.…”
Section: ) Heat Conduction In Pwbmentioning
confidence: 99%
“…Plated through-hole vias are treated as conducting fibers in the insulator matrix. The equivalent thermal conductivity in the Z-direction, , is given by (9) where is the thermal conductivity of the metal used for via plating (in this case, copper), is the thermal conductivity of the insulator (in this case, epoxy glass), is the sum of the cross-section area of the via metal per unit area of PWB.…”
Section: ) Heat Conduction In Pwbmentioning
confidence: 99%
“…Even though various functional relationships between failure rate and temperature in electronic components have been suggested (Wong [18]), according to Blanks [19], the Arrhenius relation is the most widespread model among practitioners in the electronic packaging industry. In this study, the failure rate of electronic component " " is estimated using the Arrhenius relation as (1) Here and are constants associated with the thermal sensitivity of the electronic component, while is the maximum temperature of component " ."…”
Section: Problem Definitionmentioning
confidence: 99%