2019
DOI: 10.1364/oe.27.031644
|View full text |Cite
|
Sign up to set email alerts
|

Artifact-free deconvolution in light field microscopy

Abstract: The sampling patterns of the light field microscope (LFM) are highly depth-dependent, which implies non-uniform recoverable lateral resolution across depth. Moreover, reconstructions using state-of-the-art approaches suffer from strong artifacts at axial ranges, where the LFM samples the light field at a coarse rate. In this work, we analyze the sampling patterns of the LFM, and introduce a flexible light field point spread function model (LFPSF) to cope with arbitrary LFM designs. We then propose a novel alia… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
82
0

Year Published

2020
2020
2022
2022

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 49 publications
(82 citation statements)
references
References 38 publications
0
82
0
Order By: Relevance
“…There are various works in computer vision demonstrating computational super-resolution through combining multiple aliased low-resolution images acquired at sub-pixel camera movements [32][33][34][35][36][37]. In light field photography and conventional light field microscopy, computational super-resolution was addressed by exploiting sub-lenslet sampling [16,17,21,22,38,39]. In Fourier light field microscopy, the EIs form behind the micro-lenses at specific translational offsets with respect to their corresponding micro-lens centers.…”
Section: Aliasing and Computational Super-resolutionmentioning
confidence: 99%
See 4 more Smart Citations
“…There are various works in computer vision demonstrating computational super-resolution through combining multiple aliased low-resolution images acquired at sub-pixel camera movements [32][33][34][35][36][37]. In light field photography and conventional light field microscopy, computational super-resolution was addressed by exploiting sub-lenslet sampling [16,17,21,22,38,39]. In Fourier light field microscopy, the EIs form behind the micro-lenses at specific translational offsets with respect to their corresponding micro-lens centers.…”
Section: Aliasing and Computational Super-resolutionmentioning
confidence: 99%
“…is the complex transmittance function of a lenslet and (x l , y l ) are the local lenslet coordinates, while P(x l , y l ) is the lenslet pupil function [16,17].…”
Section: Light Field Point Spread Function Modelmentioning
confidence: 99%
See 3 more Smart Citations