1989
DOI: 10.1088/0953-8984/1/sb/018
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ARUPS of water adsorption on Si(100) and Si(111) surfaces

Abstract: Water adsorption on Si(100) and Si(ll1) surfaces at room temperature has been investigated by angle-resolved ultraviolet photo-electron spectroscopy (ARUPS) using synchrotron radiation. Earlier angle-integrated UPS studies have suggested that the adsorption is non-dissociative on (100) and dissociative on (111). The ARUPS data indicate that the adsorptionis dissociative on both surfaces; the adsorbate-related valence features are similar and their binding energies agree closely with a self-consistent calculati… Show more

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Cited by 26 publications
(5 citation statements)
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“…Initial interpretations of ultraviolet photoelectron spectroscopy (UPS) on Si(100) and Si(111) suggested molecular adsorption, while electron energy loss spectroscopy (EELS) and surface IR studies showed dissociative adsorption on the basis of the Si−H and Si−O−H stretching modes. Later, photoelectron spectroscopy (PES) reinterpretation of the earlier UPS 8a data and other experiments were all consistent with dissociative adsorption. At room temperature, the sticking coefficient of water on Si(100) is near unity and constant up to saturation …”
Section: Introductionsupporting
confidence: 55%
“…Initial interpretations of ultraviolet photoelectron spectroscopy (UPS) on Si(100) and Si(111) suggested molecular adsorption, while electron energy loss spectroscopy (EELS) and surface IR studies showed dissociative adsorption on the basis of the Si−H and Si−O−H stretching modes. Later, photoelectron spectroscopy (PES) reinterpretation of the earlier UPS 8a data and other experiments were all consistent with dissociative adsorption. At room temperature, the sticking coefficient of water on Si(100) is near unity and constant up to saturation …”
Section: Introductionsupporting
confidence: 55%
“…4. ͑not shown͒ using the double-pass CMA taken at hϭ90 eV showed that the binding energies of the molecular orbitals for Si-OH are 6.7 eV for 1, 7.6 eV for 3, 11.8 eV for O, and 25.0 eV for 2, where 1 is the O-H nonbonding orbital, 3 is the O-H -bonding orbital, O is the Si-O -bonding orbital, and 2 mainly consists of the O 2s orbital. 12,13 According to our Mg K␣ XPS measurement, E O 1s is 532.7 eV. The value of in the present measurements was estimated as 4.5Ϯ0.3 eV.…”
Section: Photoelectron Spectroscopy and Aepico For The O-kvv Auger Elmentioning
confidence: 48%
“…[8][9][10][11] The results of vibrational spectroscopy led, however, to the reinterpretation of these and later results as indicating dissociative chemisorption. 8,[12][13][14][15][16] It is now generally accepted that H 2 O is dissociatively adsorbed on the Si͑100͒ surface to form Si-OH and Si-H surface species. 8 In a study by PSD with the surface irradiated by photons at 600 eV, i.e., in the region of O 1s excitation, the yield of desorbed H ϩ was Ϸ500 times as great as the yield of desorbed O ϩ .…”
Section: Introductionmentioning
confidence: 99%
“…The adsorption of water on silicon surfaces is important in the semiconductor industry and is extensively studied because of the relationships to fundamental phenomena in device fabrication such as growth of SiO 2 films by wet oxidation, etching, and the flatness of silicon surfaces. , In semiconductor processing, not only H 2 O but also O 2 are the most commonly used oxidants, but the presence of H 2 O rather than dry O 2 makes SiO 2 layers grow more rapidly and thus wet oxidation is preferred for SiO 2 films. The mechanisms of the adsorption of an H 2 O molecule on a silicon surface have been well studied theoretically. Although there has been historically some controversy concerning whether H 2 O adsorbs as a molecule on Si(100)-2 × 1 surface, or dissociates to form OH and H fragments that saturate silicon dangling bonds, a consensus now exists from various observations that water adsorbs dissociatively.…”
Section: Introductionmentioning
confidence: 99%
“…The mechanisms of the adsorption of an H 2 O molecule on a silicon surface have been well studied theoretically. [6][7][8][9] Although there has been historically some controversy concerning whether H 2 O adsorbs as a molecule on Si(100)-2 × 1 surface, or dissociates to form OH and H fragments that saturate silicon dangling bonds, a consensus now exists from various observations [10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25][26][27][28] that water adsorbs dissociatively.…”
Section: Introductionmentioning
confidence: 99%