peaks in this series are of lower intensity and are observed up to m l z in 850. Two other sets of peaks observed in Figure 8b cannot be rationalized as arising from the ions produced by simple bond cleavages of Fomblin Z. These peaks have a spacing of m / z = 166, and their mlz values coincide with the two most intense Krytox series D-2 -[FRJ and N = [OR,CF,CFJ. They are attributed to Krytox impurities in the sample and are labeled D and N in the spectrum of Figure ab.
SUMMARYIn summary, the TOF-SIMS spectra were obtained from thin films of Krytox and Fomblins Y and Z up to mlz = 6500.The fragmentation patterns were rationalized on the basis of the known structures and stabilities of the observed ions. Cationized Krytox oligomers were observed along with Krytox fragments. The fragmentation in the spectra of copolymers Fomblin Y and Z is complicated, and often several ion structures can be assigned to a given peak. The fragmentation patterns are unique for each kind of PFPE and are reproducible, independent of sample preparation and substrate. Several important points are demonstrated by this study.First, fragment ions of m / z > 300 in the perfluoropolyethers have intrinsic charge without cationization, unlike most other polymers. Second, quality spectra can be obtained from films ca. 1000 A thick, but these spectra contain peaks only due to fragment ions. Cationized oligomer ions occur only from films in the range of monolayer coverage. This demonstrates the importance of cationization for obtaining spectra from thick polymer films. Third, the study demonstrates the utility of TOF-SIMS for the structural characterization and the oligomer analysis of thin films of low molecular weight perfluorinated poly-and copolyethers. ACKNOWLEDGMENT We thank J. D. Patton of E. I. du Pont de Nemours & Co. for providing the Krytox samples and for useful discussions. Spikes, H. A.; Cann, P.; Caporiccio, G. J. Synth. Lubr. 1984, I , 73. Sinesi, D.; Zamboni, V.; Fontanelli, R.; Binaghi, M. Wear 1971, 18, 05. Baker. M. A.; Holland, L.; Laurenson, L. Vacuum 1971, 21, 479. Holland, L.; Laurenson, L.; Baker, P. N.; Davis, H. J. Nature 1972, 238, 26 --. Holland, L.; Laurenson, L.; Hurley, R. E.; Williams, K. Nucl. Instrum. Methods 1973, 11 1 , 555. Pacansky, J.; Wakman, R. J.; Maier, M. J . fhys. Chem. 1987, 91, 1225. Bktsos, I. V.; Hercules, D. M.; Greifendorf. D.; Benninghoven, A. Anal. Chem. 1985, 57, 2304. Bletsos, I. V.; Hercules, D. M.; vanleyen, D.; Benninghoven, A. Macromolecules 1987, 20. 407. Steffens, P.; Niehuis, E.; Friese, T.; Greifendorf, D.; Benninghoven, A. J. Vac. Sci. Technol., A 1985, 3 , 1322. Bletsos, I. V.; Hercules, D. M.; vanleyen, D.; Hagenhoff, 6.; Neihuis E.; Benninghoven, A. Anel. Chem., submitted for publication. Bletsos, I. V.; Hercules, D. M.; vanleyen, D.; Benninghoven, A,; Karakatsanis, C. G.; Rieck. J. N. Anal. Chem. 1989, 61, 2142. Bletsos, I. V.; Hercules, D. M.; Magill, J. H.; vanleyen, D.; Niehuls, E.; Benninghoven, A. Ions from a variety of molecules, formed vla electrospray, INTRODUCTION One of...