2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515)
DOI: 10.1109/nssmic.2003.1352668
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Assembly technique for a fine-pitch, low-noise interface; Joining a CdZnTe pixel-array detector and custom VLSI chip with Au stud bumps and conductive epoxy

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Cited by 9 publications
(9 citation statements)
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“…An 80×80 pixel piece of 1 mm thick CdTe from Acrorad was gold stud and silver epoxy [17, 18] bump bonded to an 8080 ASIC. The pixellated contact on the anode was aluminum, which forms a Schottky contact to suppress the leakage current from the bulk but doesn’t diffuse into the CdTe material and cause the pixels to short together [19].…”
Section: Measured Performancementioning
confidence: 99%
“…An 80×80 pixel piece of 1 mm thick CdTe from Acrorad was gold stud and silver epoxy [17, 18] bump bonded to an 8080 ASIC. The pixellated contact on the anode was aluminum, which forms a Schottky contact to suppress the leakage current from the bulk but doesn’t diffuse into the CdTe material and cause the pixels to short together [19].…”
Section: Measured Performancementioning
confidence: 99%
“…Gold stud bumps were attached to the aluminum pad on the ASIC chip by intentionally removing the wire from a thermosonic wirebond to leave only the ball-bond. A conductive polymer epoxy bump was placed on the pads of the detector through a stencil screen [5].…”
Section: Device Descriptionmentioning
confidence: 99%
“…The gold stud bumps are populated onto the ASIC by Integrated Packaging Assembly Corp, while Polymer Assembly Technology provides the conductive epoxy bumps and performs the flip-chip bonding. More information on these interconnects is presented in [8].…”
Section: B Interconnectmentioning
confidence: 99%