2019
DOI: 10.1117/1.oe.58.9.092609
|View full text |Cite
|
Sign up to set email alerts
|

Assessing surface imperfections of freeforms using a robotic light scattering sensor

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
3
1

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(4 citation statements)
references
References 28 publications
0
4
0
Order By: Relevance
“…The performance of optical instruments might quickly be limited by particular or molecular organic contamination (PAC, MOC) and surface defects. Beside surface roughness, these imperfections are primary origins of light scattering [1][2][3][4][5][6] that causes a reduced imaging contrast or a loss of throughput. In particular for supersmooth surfaces or thin film coatings, as those applied in space or lithography industry, even lowest imperfections levels might be performance limiting.…”
Section: Motivationmentioning
confidence: 99%
See 2 more Smart Citations
“…The performance of optical instruments might quickly be limited by particular or molecular organic contamination (PAC, MOC) and surface defects. Beside surface roughness, these imperfections are primary origins of light scattering [1][2][3][4][5][6] that causes a reduced imaging contrast or a loss of throughput. In particular for supersmooth surfaces or thin film coatings, as those applied in space or lithography industry, even lowest imperfections levels might be performance limiting.…”
Section: Motivationmentioning
confidence: 99%
“…However, imperfections on optical components are unavoidable and, therefore, budgeting and characterization becomes mandatory. On the other hand, the induced light scattering is an ideal, highly sensitive, fast, and flexible characterization tool for imperfection analysis [2][3][4][5][6] even on extended freeform surfaces [5].…”
Section: Motivationmentioning
confidence: 99%
See 1 more Smart Citation
“…At each measurement position, an image of the angle resolved scattering (ARS) 33,35 was recorded from which the local surface roughness in the spatial frequency range of about f ¼ 0.03 to 0.3 μm −1 was calculated using Rayleigh-Rice theory. 35 Although the surface is coated with a protection layer, the calculations were performed using a single surface approximation of the protective coating. 36 The roughness mapping reveals an increasing roughness from the lower left with an average of about 0.5 nm to the top right with an average roughness of about 1 nm.…”
Section: Surface Metrology and Straylightmentioning
confidence: 99%