Assessing the capabilities and limitations of cathodoluminescence microscopy to investigate the optical properties of individual nanostructures

Stowe, David

doi:10.1002/pssc.201084025

Cited by 4 publications

(3 citation statements)

References 8 publications

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“…An additional critical difference between EELS and CL is the mechanism of data acquisition. In CL, there are energy dissipation processes that occur in the beam-sample interaction volume, where excess carriers are regenerated, and it is the recombination of these carriers that generates each CL photon [49], while in EELS, the energy loss from the inelastic scattering events in the beam-sample volume is directly retrieved from changes in the same beam. This favors EELS not just in terms of spatial resolution accuracy but also in energy resolution [50].…”

Section: Exciting With Electrons and Probing With Photons (Cathodolummentioning

confidence: 99%

Multipolar and bulk modes: fundamentals of single-particle plasmonics through the advances in electron and photon techniques

2020

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Recent developments in the application of plasmonic nanoparticles have showcased the importance of understanding in detail their plasmonic resonances at the single-particle level. These resonances can be excited and probed through various methods, which can be grouped in four categories, depending on whether excitation and detection involve electrons (electron energy loss spectroscopy), photons (e.g., dark-field microscopy), or both (cathodoluminescence and photon-induced near-field electron microscopy). While both photon-based and electron-based methods have made great strides toward deepening our understanding of known plasmonic properties and discovering new ones, they have in general progressed in parallel, without much cross-pollination. This evolution can be primarily attributed to the different theoretical approaches driving these techniques, mainly dictated by the inherent different nature of electrons and photons. The discrepancies that still exist among them have hampered the development of a holistic approach to the characterization of plasmonic materials. In this review therefore, we aim to briefly present those electron-based and photon-based methods fundamental to the study of plasmonic properties at the single-particle level, with an eye to new behaviors involving multipolar, propagating, and bulk modes coexisting in colloidal nanostructures. By exploring the key fundamental discoveries in nanoparticle plasmonics achieved with these techniques, herein we assess how integrating this information could encourage the creation of a unified understanding of the various phenomena occurring in individual nanoparticles, which would benefit the plasmonics and electron microscopy communities alike.

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Section: Exciting With Electrons and Probing With Photons (Cathodolummentioning

confidence: 99%

Multipolar and bulk modes: fundamentals of single-particle plasmonics through the advances in electron and photon techniques

2020

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“…Based on the range of defect emission energies, the Zn(Ac):KOH ratio appears to influence the density and size of zinc vacancy V Zn clusters [34]. Overall, multiple reviews of CLS applied to ZnO nanostructures are now available [35,36,37,38,39,40,41], and numerous studies have shown impurities and defects localized inside nanostructures [42,43,44,45,46].…”

Section: Defect Distributions In Znomentioning

confidence: 99%

Native Point Defect Measurement and Manipulation in ZnO Nanostructures

et al. 2019

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This review presents recent research advances in measuring native point defects in ZnO nanostructures, establishing how these defects affect nanoscale electronic properties, and developing new techniques to manipulate these defects to control nano- and micro- wire electronic properties. From spatially-resolved cathodoluminescence spectroscopy, we now know that electrically-active native point defects are present inside, as well as at the surfaces of, ZnO and other semiconductor nanostructures. These defects within nanowires and at their metal interfaces can dominate electrical contact properties, yet they are sensitive to manipulation by chemical interactions, energy beams, as well as applied electrical fields. Non-uniform defect distributions are common among semiconductors, and their effects are magnified in semiconductor nanostructures so that their electronic effects are significant. The ability to measure native point defects directly on a nanoscale and manipulate their spatial distributions by multiple techniques presents exciting possibilities for future ZnO nanoscale electronics.

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“…73,74 Several comprehensive reviews of CLS applied to ZnO nanostructures are now available. 75,76,77,78,79 This chapter focuses on a very specific aspect of ZnO, i.e., the nature and spatiallyresolved distribution of defects at their interfaces and in particular inside their micro-and nanostructures. In general, defects in semiconductors have negative effects: they introduce states that can trap charge, increase non-radiative recombination, alter Schottky barriers and ohmic contacts.…”

Section: Introductionmentioning

confidence: 99%

Spatially-resolved cathodoluminescence spectroscopy of ZnO defects

Brillson

Ruane

Hui-bin

et al. 2017

Materials Science in Semiconductor Processing

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Spatially-resolved cathodoluminescence spectroscopy has contributed significant new information to our understanding of native point defects in ZnO micro-and nanoscale structures. This paper aims to review representative examples of this work and the new perspectives gained from spatially resolving these defects both laterally and depth-wise. Results obtained from many groups worldwide include studies of Schottky diodes, polycrystalline ceramics, nanostructures, and microwires. The nature and spatial distribution of native point defects in these materials together with their strong dependence on growth and processing suggest new avenues for their control in transport and optoelectronic device structures.

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Assessing the capabilities and limitations of cathodoluminescence microscopy to investigate the optical properties of individual nanostructures

Cited by 4 publications

References 8 publications

Multipolar and bulk modes: fundamentals of single-particle plasmonics through the advances in electron and photon techniques

Multipolar and bulk modes: fundamentals of single-particle plasmonics through the advances in electron and photon techniques

Native Point Defect Measurement and Manipulation in ZnO Nanostructures

Spatially-resolved cathodoluminescence spectroscopy of ZnO defects

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