“…It does not have limitations in terms of the equipment dimensions, but it has also many drawbacks, such as: -time-consuming analysis of the results of studies, because for each measuring point at least one graph is obtained; the more configuration cases -the more graphs, hence the analysis of results becomes complicated, -it is required to strictly stick to the test plan and configuration settings, to ensure repeatability, -orientation of the probe in space is changed manually, hence the imprecision of the probe orientation in space can result in measurement errors and the distortion of the image of disturbance emission from the device. Summarising, the location methods for disturbance sources known from the literature, using measurements in the near-field zone for printed circuit boards PCB [13,14,15,17,20,23] and for integrated circuits [21], are a good approach leading to the design compliance with the requirements of standards, and later on to a smooth passing through the stage of EMC tests in the laboratory. However, in the case of a more complex equipment, e.g.…”