Assessment of Interface Trap Charges on Proposed TFET for Low Power High-Frequency Application

Kumar, Sachin; Yadav, Dharmendra Singh

doi:10.1007/s12633-021-01616-0

Silicon

2022

DOI: 10.1007/s12633-021-01616-0

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Assessment of Interface Trap Charges on Proposed TFET for Low Power High-Frequency Application

Sachin Kumar

Dharmendra Singh Yadav

Abstract: Noname manuscript No.

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Cited by 8 publications

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et al. 2023

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Assessment of Interface Trap Charges on Proposed TFET for Low Power High-Frequency Application

Abstract: Noname manuscript No.

Cited by 8 publications

References 42 publications

Effects of electron irradiation on analog and linearity performance of InP-based HEMT

Effects of electron irradiation on analog and linearity performance of InP-based HEMT

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