Assurance Benefits of ISO 26262 Compliant Microcontrollers for Safety-Critical Avionics

Schwierz, Andreas; Forsberg, Håkan

doi:10.1007/978-3-319-99130-6_3

Cited by 3 publications

(2 citation statements)

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“…Many systems are based on powerful processing units that must be fail-safe and guarantee continuous service delivery. Each application sector must comply with standards and guidelines to meet such requirements as seen in the automotive [1], aerospace [2,3], and military [4] industries. With the introduction of the RISC-V architecture, several projects and research efforts were initiated to adopt these novel RISC-based processors in many application domains.…”

Section: Introductionmentioning

confidence: 99%

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Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip

et al. 2023

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Recent research has shown interest in adopting the RISC-V processors for high-reliability electronics, such as aerospace applications. The openness of this architecture enables the implementation and customization of the processor features to increase their reliability. Studies on hardened RISC-V processors facing harsh radiation environments apply fault tolerance techniques in the processor core and peripherals, exploiting system redundancies. In prior work, we present a hardened RISC-V System-on-Chip (SoC), which could detect and correct radiation-induced faults with limited fault awareness. Therefore, in this work, we propose solutions to extend the fault observability of the SoC implementation by providing error detection and monitoring. For this purpose, we introduce observation features in the redundant structures of the system, enabling the report of valuable information that supports enhanced radiation testing and support the application to perform actions to recover from critical failures. Thus, the main contribution of this work is a solution to improve fault awareness and the analysis of the fault models in the system. In order to validate this solution, we performed complementary experiments in two irradiation facilities, comprehending atmospheric neutrons and a mixed-field environment, in which the system proved to be valuable for analyzing the radiation effects on the processor core and its peripherals. In these experiments, we were able to obtain a range of error reports that allowed us to gain a deeper understanding of the faults mechanisms, as well as improve the characterization of the SoC.

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Section: Introductionmentioning

confidence: 99%

“…Dual Modular Redundancy,2 Distributed Triple Modular Redundancy,3 High SEE immunity (flash-based FPGA),4 Analysis only for high-level outcomes of the fault injection campaign,5 Error rate and classification.…”

mentioning

confidence: 99%