In preparation for the High Luminosity LHC (HL-LHC) runs,
the ATLAS inner detector will be completely replaced with an all
silicon Inner Tracker (ITk). Hybrid silicon pixel modules will be
used for the innermost tracking layers, and silicon micro-strip
detectors will be used the outer layers of the tracker. During the
production of the detector, the sensors, readout electronics, and
other components will undergo a series of quality control (QC) and
quality assurance tests. Defects in the fabrication of the sensors
will be flagged early in the manufacturer's and ATLAS QC tests. A
study of the influence of sensor defects was performed to assess the
characteristics of these defects in completed modules, and whether
any defect posed a risk to the operation of the front-end readout
electronics. All defects were found to have no impact on the
performance of the front-end readout electronics for healthy
amplifier channels, and defects that short the coupling between the
strip implant and the metal readout electrode were only noticeable
for strip leakage currents in excess of 250 nA, beyond the
end-of-life currents expected for most sensors at the HL-LHC.