2020
DOI: 10.1016/j.sab.2020.105973
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Atmospheric air oxidation of 9Cr-1Mo steel: Depth profiling of oxide layers using glow discharge optical emission spectrometry

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Cited by 17 publications
(3 citation statements)
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“…33 Thus, the latter reflects the fact that the integration of the boron peak is directly proportional to the amount of boron incorporated into the diamond film. This methodology is also known as the "intensity to composition conversion factors (ICF) method", extensively used in glow discharge mass spectrometry (GDMS), 37,38 currently a topic of an ISO standard under preparation. However, the standard ICF method lacks in providing the depth profile information together with the compositional information, whereas its combination with DIP overcomes this limitation and makes it powerful in GD-OES.…”
Section: Resultsmentioning
confidence: 99%
“…33 Thus, the latter reflects the fact that the integration of the boron peak is directly proportional to the amount of boron incorporated into the diamond film. This methodology is also known as the "intensity to composition conversion factors (ICF) method", extensively used in glow discharge mass spectrometry (GDMS), 37,38 currently a topic of an ISO standard under preparation. However, the standard ICF method lacks in providing the depth profile information together with the compositional information, whereas its combination with DIP overcomes this limitation and makes it powerful in GD-OES.…”
Section: Resultsmentioning
confidence: 99%
“…Increasing both the temperature and the oxidation time will lead to a decrease in the height of block-shaped oxides, which will sometimes increase the adhesion of the oxide shells. Jagadeeswara Rao et al [36] studied atmospheric air oxidation of 9Cr-1Mo steel and found that as increasing the time of oxidation to 50 h increased the size of the oxide globules, yielding two different morphologies of platelet and globules.…”
Section: Surface Morphology Examinationmentioning
confidence: 99%
“…Glow discharge (GD) source coupled with mass spectrometry or optical emission spectrometry provides an alternative technique for high resolution depth profile analysis of layered samples. [18][19][20] During the sputtering of the GD source, atoms are separated from the material surface layer by layer; moreover, the GD source is a very stable atomization and ionization source, and a flat crater can be obtained on the sample surface after sputtering, 7 which allows GD spectrometric techniques to efficiently determine depth profile analysis of the samples. Glow discharge mass spectrometry (GD-MS) is one of the most effective tools to directly analyze the elements of solid samples [22][23][24][25][26][27][28] and has been increasingly applied for the depth profile analysis of thick and thin layers.…”
Section: Introductionmentioning
confidence: 99%